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NEWSROOM
Penn State MRI Partners with ICDS on Automated Microscope Data Transfer
Penn State's Materials Research Institute is launching a solution with the Institute for Computational and Data Sciences for automated, high-speed transfer of data from all MCL electron microscopes directly to ICDS.
Oct 151 min read
JEOL launches HAXIS ion-milling SEM for semiconductor failure analysis
JEOL has started sales of HAXIS, a scanning electron microscope with low-angle argon ion milling and passive voltage contrast detection, for layer-by-layer semiconductor failure analysis.
Oct 51 min read
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