NEWSROOM

Delmic launched SPARC 3.0, its latest cathodoluminescence platform for SEM, at IMC21 in Liverpool. The system supports up to eight imaging modes and spectral coverage from 185 nm to 1700 nm.

TESCAN ORSAY HOLDING, a.s. has described an A15 semiconductor failure analysis workflow that connects X-ray CT, ultrafast laser processing, optical and confocal microscopy, and SEM for progressive access to buried structures.